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专利名称：Microprocessor memory test circuit and
method
发明人：Gianluca Petrosino申请号：US08/579007申请日：19951227公开号：US05712822A公开日：19980127
摘要：A circuit and method for testing on-chip memory for a microprocessor or amicrocomputer is disclosed. The memory test circuit includes an input register, an outputregister, an adder, and a sequencer to control the test process. The process includesreceiving a simple communication protocol from the control unit to start the test,running a common memory test such as a checker board, AAAAh, 5555h and the like, andthen storing the test results in an output register. The test circuit can include a bi-directional RESET signal means for disabling the system while the microprocessor ormicrocomputer runs its memory test.
申请人：SGS-THOMSON MICROELECTRONICS, INC.
代理人：David V. Carlson,Theodore E. Galanthay,Lisa K. Jorgenson
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